Wang, Lei#, Jin Lei, Yu Li Hua, Dong Song Tao, Chen Jian, Xu Jun Hua#. Evaluation of electric field intensity on atom diffusion of Cu/Ta/Si stacks during annealing. Applied Physics A, 2015 122(1)
Wang, Lei#, Jin Lei, Yu Li Hua, Dong Song Tao, Chen Jian, Xu Jun Hua#. Evaluation of electric field intensity on atom diffusion of Cu/Ta/Si stacks during annealing. Applied Physics A, 2015 122(1)